Eureka 对记忆模组进行快速的功能动态测试，并采用多个先进的检查模式来检测出短/断路**、单一颗粒**、记忆胞间的绝缘**、时序及杂讯问题引起的间歇性**…等记忆体测试设备 Eureka
加装选购的漏电流测试转接模组后，即可进行半导体漏电流特性的测试，并能检出DRAM晶片的微小漏电流。
Eureka 具有内建的SPD(serial presence detect)烧录器可用来烧录及验证测试SPD内容，可在记忆体模组测试时随同进行。
Eureka加入了许多加强功能来提升测试的正确性，像晶片预热chip-heating，电源电压变动模拟voltage bouncing，循环(回路)测试loop test，
可调式时基adjustable timing parameters (selected)，可调整式更新模式及周期alterable refresh mode and cycle，更新测试refresh test，
ICC电流测定，也有Address与RAS/CAS测试，不论有/无缓冲级的模组，Eureka都能支援同位与ECC 位元检查，
另外，Eureka也能配合CST*新的RoboFlex自动取置机 来进行全自动测试，其效能表现更是如虎添翼，此外，可额外选购加装的测试配备有Flash testing，
Cache testing，DRAM & SDRAM TSOP Chips testing

规格

DDR testing platform

Clock Frequency

200 Mhz & 266 Mhz selectable

Address Depth

4 Gigawords test capacity up to 16 row x 16 column

Data Width

Expandable up to 80 bits

Timing Range

-1 , 0 and 1 ns

Timing Resolution

1 ns

Vdd Range

0.1V to 2.7V with 0.1V step and 10%Bounce

Vih, Voref Range

0.1V to 2.7V with 0.1V step

Read Latency

2,3 clocks

Refresh Cycle

Auto/Self Refresh - 8祍/Row

Refresh Modes

Auto Refresh , Self Refresh

Leakage Test Option

+/- 1礎 to +/- 5mA

Test Features

Burst Mode, Programmable Data Mask, Data Strobe, and Clock Suspend Modes

Current Test

Icc Standby, Icc Operating-Avg Icc up to 1.5A, Peak Curent up to 2.0A

Burst Length

Programmable to 2,4,8

CAS Latency

Programmable read Latency From Column Address

Serial PD

256 Bytes programmable

Testing Support Options

DDR 184pin DIMM and 200pin SODIMM

SDRAM testing platform

Clock Frequency

133 mhz 100 mhz, 66mhz, 33mhz selectable

Address Depth

4 Gigawords test capacity up to 16 row x 16 column

Data Width

Expandable up to 160 bits

Timing Range

0ns to 20ns in 1ns resolution

Timing Resolution

in steps of 1ns resolution

Vcc Range

0.1V to 3.6V with 0.1V step and 10 %Bounce

Vih, Voref Range

0.1V to 3.6V with 0.1V step

Read Latency

1,2,3 clocks

Refresh Cycle

Auto/Self Refresh - 8祍/Row to 64祍/Row

Refresh Modes

RAS only, CAS before RAS, Self Refresh

Leakage Test Option

+/- 1礎 to +/- 5mA

Test Features

Burst Mode, Programmable Data Mask and Clock Suspend Modes

Current Test

Icc Standby, Icc Operating-Avg Icc up to 1.5A, Peak Curent up to 2.0A

Burst Length

Programmable to 1,2,4,8 or Full Page

CAS Latency

Programmable read Latency From Column Address

Serial PD

256 Bytes programmable

Testing Support Options

SDRAM 100p, 168p, 200p, 244p, 278p DIMM, 144p Sodimm, TSOP, SGRAM 144p and many more

General specifications

Power Requirements

90-130 VAC, 180-260 VAC at 50Hz or 60 Hz

Operating Temperature

-20 to 100 degree Fahrenheit

Humidity

20% to 80%, non condensing

Overcurrent Protection

2A; to prevent Vcc and Ground short problems

Host Computer Requirement (Not Included)

IBM PC or Compatible 386/486/Pentium with one ISA or EISA bus interface slot available for CST, Inc. proprietary interface card

Operating System Requirement (Not Included)

Standard Microsoft Window Windows 95/9